Diffraction Intensity Measurement Apparatus
This Diffraction Intensity Measurement Apparatus features a 100 cm aluminum rail with a black matte coating to minimize light reflection and interference during experiments. The system includes three movable carriages: two move along a single axis, while one moves in three directions.
Description
This Diffraction Intensity Measurement Apparatus features a 100 cm aluminum rail with a black matte coating to minimize light reflection and interference during experiments. The system includes three movable carriages: two move along a single axis, while one moves in three directions. The light source is a 650 nm laser diode with a long service life and includes a cylindrical lens. The laser position can be adjusted in two directions, and the light intensity is also adjustable. The detector is a linear CCD light distribution sensor with 2,700 photosensitive elements. Its spectral response range is 0.3 to 0.9 μm, and the spatial resolution is 11 μm. This apparatus provides highly precise diffraction intensity data.
Improved Design Advantages
This Diffraction Intensity Measurement Apparatus offers two major advantages. First, compared to area CCD systems, it displays the complete light intensity distribution curve, allowing students to observe not only bright and dark fringes but also the full curve shape with high resolution and fine detail. Second, compared with mechanically scanned photodiode systems, it captures the entire intensity distribution instantly without requiring mechanical movement.
The grating holder can be adjusted in three directions: tilt, left-right, and up-down. The left-right adjustment range is 70 mm, with a positioning accuracy of 0.1 mm using a vernier scale. The clamp includes a cushioning mechanism to protect the gratings. The system is highly user-friendly.
Seven Grating Patterns
This Diffraction Intensity Measurement Apparatus includes a combined grating set with 7 groups and 14 patterns, including single slit, single wire, double slit, triple slit, four-slit, and five-slit configurations. Results are displayed on an oscilloscope, and no darkroom is required. The system can also be used for additional optical experiments. The minimum order quantity is one unit, and different models can be combined in a single order. Third-party inspection is supported. Our goal is to support physics education worldwide. This apparatus has also won an award in a national teaching instrument competition.
Key Parameters
|
Parameter |
Value |
|
Rail Length |
100 cm |
|
Laser Wavelength |
650 nm |
|
CCD Elements |
2,700 |
|
CCD Resolution |
11 μm |
|
Grating Patterns |
7 groups (14 patterns) |
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